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X-Ray Flourescense (XRF) is a well established and traceable technique for elemental analysis, both qualitative as well as quantitative. XRF is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source.
Volga Instruments Pvt. Ltd. Supplies EDXRF and MWDXRF. The available models are: